Details

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BUY IRGP4063D https://www.utsource.net/itm/p/12607560.html

Parameter	Symbol	Test Conditions	Min	Typical	Max	Unit
Collector-Emitter Voltage	VCEO	IC = 0, IC = 0	-	550	-	V
Collector-Base Voltage	VCBO	IE = 0, IC = 0	-	600	-	V
Emitter-Base Voltage	VEBO	IC = 0, IE = 100 渭A	-	5	-	V
Continuous Collector Current	IC	TC = 25掳C	-	30	-	A
Continuous Collector Current	IC	TC = 100掳C	-	18	-	A
Continuous Emitter Current	IE	TC = 25掳C	-	30	-	A
Continuous Emitter Current	IE	TC = 100掳C	-	18	-	A
Total Device Dissipation	PTOT	TC = 25掳C	-	360	-	W
Total Device Dissipation	PTOT	TC = 100掳C	-	220	-	W
Junction Temperature	TJ	-	-	150	-	掳C
Storage Temperature Range	TSTG	-	-55	-	150	掳C
Forward Transconductance	gfs	VCE = 10 V, IC = 10 A	30	-	60	S
Base-Emitter Saturation Voltage	VBE(sat)	IC = 10 A, IB = 1 A	1.2	-	1.8	V
Collector-Emitter Saturation Voltage	VCE(sat)	IC = 10 A, IB = 1 A	1.2	-	1.8	V
Turn-On Delay Time	td(on)	VGE = 15 V, IC = 10 A	-	50	-	ns
Rise Time	tr	VGE = 15 V, IC = 10 A	-	50	-	ns
Turn-Off Delay Time	td(off)	VGE = 0 V, IC = 10 A	-	75	-	ns
Fall Time	tf	VGE = 0 V, IC = 10 A	-	75	-	ns

Instructions for Use:

1. Handling Precautions:

   • Handle the device with care to avoid mechanical damage.
   • Use proper ESD (Electrostatic Discharge) protection measures to prevent damage from static electricity.

2. Mounting:

   • Ensure proper thermal management by using heat sinks or other cooling methods to keep the junction temperature within the specified limits.
   • Follow the recommended PCB layout guidelines to minimize parasitic inductances and capacitances.

3. Biasing:

   • Ensure that the base-emitter voltage (V_BE) is within the specified range to avoid damaging the device.
   • Use appropriate gate drive circuits to provide the necessary current for turn-on and turn-off operations.

4. Operating Conditions:

   • Do not exceed the maximum ratings for collector-emitter voltage (V_CEO), collector-base voltage (V_CBO), and emitter-base voltage (V_EBO).
   • Keep the collector current (I_C) and total device dissipation (P_TOT) within the specified limits to ensure reliable operation.

5. Testing:

   • Use the test conditions provided in the parameter table for accurate measurements.
   • Perform regular testing to monitor the performance and health of the device.

6. Storage:

   • Store the device in a dry, cool environment to prevent moisture damage.
   • Follow the storage temperature range (T_STG) to ensure long-term reliability.

(For reference only)