SGB02N120

SGB02N120


Specifications
SKU
12607647
Details

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Parameter Symbol Min Typ Max Unit Description
Breakdown Voltage BV - 1200 - V Maximum repetitive peak reverse voltage
Continuous Drain Current ID - 2.0 - A Continuous drain current at Tc = 25掳C
Pulse Drain Current Ipp - 8.0 - A Non-repetitive peak pulse current, tp = 10 渭s
Gate-Source Voltage VGS -20 - 20 V Maximum gate-source voltage
Drain-Source On-Resistance RDS(on) - 2.4 - On-state resistance at VGS = 15V, ID = 2A
Input Capacitance Ciss - 1650 - pF Input capacitance at VDS = 500V, f = 1 MHz
Output Capacitance Coss - 330 - pF Output capacitance at VDS = 500V, f = 1 MHz
Reverse Transfer Capacitance Crss - 400 - pF Reverse transfer capacitance at VDS = 500V, f = 1 MHz
Total Gate Charge Qg - 90 - nC Total gate charge at VDS = 500V, ID = 2A
Turn-On Delay Time td(on) - 25 - ns Turn-on delay time at VDS = 500V, ID = 2A
Rise Time tr - 35 - ns Rise time at VDS = 500V, ID = 2A
Turn-Off Delay Time td(off) - 20 - ns Turn-off delay time at VDS = 500V, ID = 2A
Fall Time tf - 30 - ns Fall time at VDS = 500V, ID = 2A
Junction Temperature TJ -55 - 150 掳C Operating junction temperature range
Storage Temperature Tstg -55 - 150 掳C Storage temperature range

Instructions for Use:

  1. Power Supply and Biasing:

    • Ensure the supply voltage does not exceed the maximum breakdown voltage (BV) of 1200V.
    • Apply the appropriate gate-source voltage (VGS) within the range of -20V to +20V.
  2. Current Handling:

    • Do not exceed the continuous drain current (ID) of 2.0A at a case temperature (Tc) of 25掳C.
    • For pulse applications, ensure the non-repetitive peak pulse current (Ipp) does not exceed 8.0A for a pulse duration of 10 渭s.
  3. Thermal Management:

    • Operate the device within the specified junction temperature range (-55掳C to 150掳C).
    • Use appropriate heat sinks or cooling methods to manage thermal dissipation, especially under high current conditions.
  4. Capacitance and Charge:

    • Account for the input capacitance (Ciss), output capacitance (Coss), and reverse transfer capacitance (Crss) when designing the circuit to avoid instability or excessive switching losses.
    • Consider the total gate charge (Qg) for efficient gate drive design.
  5. Switching Characteristics:

    • Optimize the turn-on delay time (td(on)), rise time (tr), turn-off delay time (td(off)), and fall time (tf) for minimal switching losses and reliable operation.
  6. Storage:

    • Store the device in a dry environment within the storage temperature range (-55掳C to 150掳C).
  7. Handling:

    • Handle the device with care to avoid mechanical damage and static discharge. Use ESD protection measures during handling and assembly.

By following these parameters and instructions, you can ensure optimal performance and reliability of the SGB02N120 MOSFET.

(For reference only)

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