Details
BUY SGB02N120 https://www.utsource.net/itm/p/12607647.html
| Parameter | Symbol | Min | Typ | Max | Unit | Description |
|---|---|---|---|---|---|---|
| Breakdown Voltage | BV | - | 1200 | - | V | Maximum repetitive peak reverse voltage |
| Continuous Drain Current | ID | - | 2.0 | - | A | Continuous drain current at Tc = 25掳C |
| Pulse Drain Current | Ipp | - | 8.0 | - | A | Non-repetitive peak pulse current, tp = 10 渭s |
| Gate-Source Voltage | VGS | -20 | - | 20 | V | Maximum gate-source voltage |
| Drain-Source On-Resistance | RDS(on) | - | 2.4 | - | 惟 | On-state resistance at VGS = 15V, ID = 2A |
| Input Capacitance | Ciss | - | 1650 | - | pF | Input capacitance at VDS = 500V, f = 1 MHz |
| Output Capacitance | Coss | - | 330 | - | pF | Output capacitance at VDS = 500V, f = 1 MHz |
| Reverse Transfer Capacitance | Crss | - | 400 | - | pF | Reverse transfer capacitance at VDS = 500V, f = 1 MHz |
| Total Gate Charge | Qg | - | 90 | - | nC | Total gate charge at VDS = 500V, ID = 2A |
| Turn-On Delay Time | td(on) | - | 25 | - | ns | Turn-on delay time at VDS = 500V, ID = 2A |
| Rise Time | tr | - | 35 | - | ns | Rise time at VDS = 500V, ID = 2A |
| Turn-Off Delay Time | td(off) | - | 20 | - | ns | Turn-off delay time at VDS = 500V, ID = 2A |
| Fall Time | tf | - | 30 | - | ns | Fall time at VDS = 500V, ID = 2A |
| Junction Temperature | TJ | -55 | - | 150 | 掳C | Operating junction temperature range |
| Storage Temperature | Tstg | -55 | - | 150 | 掳C | Storage temperature range |
Instructions for Use:
Power Supply and Biasing:
- Ensure the supply voltage does not exceed the maximum breakdown voltage (BV) of 1200V.
- Apply the appropriate gate-source voltage (VGS) within the range of -20V to +20V.
Current Handling:
- Do not exceed the continuous drain current (ID) of 2.0A at a case temperature (Tc) of 25掳C.
- For pulse applications, ensure the non-repetitive peak pulse current (Ipp) does not exceed 8.0A for a pulse duration of 10 渭s.
Thermal Management:
- Operate the device within the specified junction temperature range (-55掳C to 150掳C).
- Use appropriate heat sinks or cooling methods to manage thermal dissipation, especially under high current conditions.
Capacitance and Charge:
- Account for the input capacitance (Ciss), output capacitance (Coss), and reverse transfer capacitance (Crss) when designing the circuit to avoid instability or excessive switching losses.
- Consider the total gate charge (Qg) for efficient gate drive design.
Switching Characteristics:
- Optimize the turn-on delay time (td(on)), rise time (tr), turn-off delay time (td(off)), and fall time (tf) for minimal switching losses and reliable operation.
Storage:
- Store the device in a dry environment within the storage temperature range (-55掳C to 150掳C).
Handling:
- Handle the device with care to avoid mechanical damage and static discharge. Use ESD protection measures during handling and assembly.
By following these parameters and instructions, you can ensure optimal performance and reliability of the SGB02N120 MOSFET.
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