PALCE22V10Q-25PC/4

PALCE22V10Q-25PC/4


Specifications
SKU
12607769
Details

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Parameter Description Value
Device Type Programmable Array Logic with CMOS EEPROM Technology PALCE22V10Q-25PC/4
Package Plastic Dual In-Line Package (PDIP) 20-Pin
Operating Voltage (VCC) Supply Voltage Range 4.5V to 5.5V
Output Drive Current High-Level Output Current (IOH) -10mA
Output Drive Current Low-Level Output Current (IOL) 16mA
Propagation Delay Time Typical Propagation Delay (tpd) 10ns (max)
Power Consumption Maximum Power Dissipation (PD) 300mW
Temperature Range Operating Temperature (Tamb) 0掳C to 70掳C
Storage Temperature Storage Temperature (Tstg) -65掳C to 150掳C
Programming Voltage Programming Voltage (VPP) 12.6V 卤 0.5V
Programming Current Programming Current (IPP) 25mA (max)
Erase Time Typical Erase Time 10ms (max)
Write Time Typical Write Time 10ms (max)
Endurance Number of Program/Erase Cycles 100,000 cycles (min)
Data Retention Data Retention Time 10 years (min)

Instructions for Use

  1. Power Supply:

    • Connect VCC to the positive supply voltage (4.5V to 5.5V).
    • Connect GND to the ground.
  2. Programming:

    • Use a suitable programmer that supports the PALCE22V10Q-25PC/4.
    • Apply the programming voltage (VPP) of 12.6V 卤 0.5V to the appropriate pin.
    • Ensure the programming current (IPP) does not exceed 25mA.
  3. Erasing:

    • Apply the erase voltage (VPP) of 12.6V 卤 0.5V to the appropriate pin.
    • The typical erase time is 10ms (max).
  4. Writing:

    • After erasing, apply the programming voltage (VPP) and data to the appropriate pins.
    • The typical write time is 10ms (max).
  5. Handling:

    • Handle the device with care to avoid static damage.
    • Store the device in a dry environment within the specified storage temperature range (-65掳C to 150掳C).
  6. Operating Conditions:

    • Ensure the operating temperature (Tamb) remains within the range of 0掳C to 70掳C.
    • Do not exceed the maximum power dissipation (PD) of 300mW.
  7. Testing:

    • After programming, verify the device using a suitable test setup to ensure correct functionality.
  8. Endurance and Data Retention:

    • The device is rated for a minimum of 100,000 program/erase cycles.
    • Data retention is guaranteed for at least 10 years under normal operating conditions.
(For reference only)

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