FTA02N65

FTA02N65


Specifications
SKU
12608044
Details

BUY FTA02N65 https://www.utsource.net/itm/p/12608044.html

Parameter Symbol Min Typ Max Unit Notes
Drain-Source Voltage VDS -650 - - V
Gate-Source Voltage VGS -15 - 15 V
Continuous Drain Current ID - 2.0 - A @ TC = 25掳C
Pulse Drain Current ID(peak) - 4.7 - A @ TC = 25掳C, tp = 10 渭s, IG = 4 A
Power Dissipation PTOT - - 93 W @ TC = 25掳C
Junction Temperature TJ - - 150 掳C
Storage Temperature TSTG -55 - 150 掳C
Thermal Resistance R胃JC - 1.5 - 掳C/W Junction to Case
R胃JA - 62 - 掳C/W Junction to Ambient

Instructions for Use:

  1. Voltage Ratings:

    • Ensure that the drain-source voltage (VDS) does not exceed 650V.
    • The gate-source voltage (VGS) should be within 卤15V.
  2. Current Ratings:

    • The continuous drain current (ID) should not exceed 2.0A at a case temperature of 25掳C.
    • For pulse applications, the peak drain current (ID(peak)) can go up to 4.7A for a pulse duration of 10 渭s, with a gate current of 4A and a case temperature of 25掳C.
  3. Power Dissipation:

    • The maximum power dissipation (PTOT) is 93W at a case temperature of 25掳C. Ensure adequate heat sinking to manage power dissipation.
  4. Temperature Limits:

    • The junction temperature (TJ) must not exceed 150掳C.
    • The storage temperature range (TSTG) is from -55掳C to 150掳C.
  5. Thermal Management:

    • The thermal resistance from the junction to the case (R胃JC) is 1.5掳C/W.
    • The thermal resistance from the junction to the ambient (R胃JA) is 62掳C/W. Use appropriate heat sinks or cooling methods to maintain safe operating temperatures.
  6. Handling Precautions:

    • Handle the device with care to avoid mechanical damage.
    • Use proper ESD protection to prevent damage from static electricity.
    • Follow recommended soldering profiles to avoid thermal stress during assembly.
  7. Mounting:

    • Ensure that the device is securely mounted to the PCB and any necessary heat sinks.
    • Use thermal paste or other thermal interface materials to enhance heat transfer between the device and the heat sink.
  8. Testing:

    • Perform initial testing under controlled conditions to verify proper operation.
    • Monitor temperature and current levels during operation to ensure they remain within specified limits.
(For reference only)

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