Details
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| Parameter | Symbol | Min | Typical | Max | Unit |
|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | - | 30 | V |
| Gate-Source Voltage | VGS | -10 | - | 10 | V |
| Continuous Drain Current | ID | - | 3.5 | - | A |
| Pulse Drain Current (tp = 10 ms) | ID(pulse) | - | 5.3 | - | A |
| RDS(on) at VGS = 4.5V | RDS(on) | - | 6.5 | - | m惟 |
| RDS(on) at VGS = 2.5V | RDS(on) | - | 8.5 | - | m惟 |
| Gate Charge | QG | - | 13 | - | nC |
| Input Capacitance | Ciss | - | 105 | - | pF |
| Output Capacitance | Coss | - | 25 | - | pF |
| Reverse Transfer Capacitance | Crss | - | 10 | - | pF |
| Junction Temperature | TJ | -55 | - | 150 | 掳C |
| Storage Temperature | Tstg | -55 | - | 150 | 掳C |
Instructions for Use:
Voltage Ratings:
- Ensure that the drain-source voltage (VDS) does not exceed 30V.
- The gate-source voltage (VGS) should be within -10V to 10V.
Current Ratings:
- The continuous drain current (ID) should not exceed 3.5A.
- For pulse applications, the peak drain current (ID(pulse)) can go up to 5.3A for a pulse duration of 10 ms.
On-State Resistance:
- The on-state resistance (RDS(on)) is 6.5 m惟 at a gate-source voltage of 4.5V and 8.5 m惟 at 2.5V. Ensure the gate voltage is sufficient to minimize power loss.
Capacitance:
- Be aware of the input capacitance (Ciss), output capacitance (Coss), and reverse transfer capacitance (Crss) when designing circuits to avoid unwanted oscillations or switching losses.
Temperature:
- The junction temperature (TJ) should be kept between -55掳C and 150掳C to ensure reliable operation.
- The storage temperature (Tstg) is also -55掳C to 150掳C, which is important for handling and storage conditions.
Handling:
- Handle the device with care to avoid static damage. Use proper ESD protection equipment.
- Follow recommended soldering profiles to prevent thermal damage during assembly.
Mounting:
- Ensure good thermal management by using appropriate heatsinks if necessary, especially for high-current applications.
Testing:
- When testing, use a constant current source to avoid exceeding the maximum ratings and damaging the device.
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