74HCT646AP

74HCT646AP


Specifications
SKU
12608373
Details

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Parameter Symbol Min Typical Max Unit Condition
Supply Voltage VCC 2.0 - 5.5 V -
Input Low Voltage VIL - 0.8 - V VCC = 4.5V to 5.5V
Input High Voltage VIH - 2.0 - V VCC = 4.5V to 5.5V
Output Low Voltage VOL - 0.1 0.4 V IOL = 16mA, VCC = 4.5V to 5.5V
Output High Voltage VOH 4.4 - - V IOH = -0.4mA, VCC = 4.5V to 5.5V
Input Leakage Current IIL - 卤1 - 渭A VCC = 4.5V to 5.5V
Output Leakage Current IOL - 卤100 - nA VCC = 4.5V to 5.5V
Propagation Delay Time tpd - 14 30 ns VCC = 5.0V, VOH = 3.5V, VOL = 1.5V, IL = 16mA, IH = -0.4mA
Power Dissipation PD - - 100 mW Per Package
Operating Temperature Range TA -40 - 85 掳C -
Storage Temperature Range TSTG -65 - 150 掳C -

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the range of 2.0V to 5.5V.
    • Connect the ground (GND) pin to the system ground.
  2. Input Signals:

    • Input signals should be within the valid logic levels:
      • Low (VIL): 0.8V or less at VCC = 4.5V to 5.5V.
      • High (VIH): 2.0V or more at VCC = 4.5V to 5.5V.
    • Avoid floating inputs; tie them to a known state (high or low) if not actively driven.
  3. Output Signals:

    • Output low (VOL) should be 0.4V or less when sourcing 16mA.
    • Output high (VOH) should be 4.4V or more when sinking -0.4mA.
    • Ensure the load does not exceed the maximum current ratings.
  4. Propagation Delay:

    • The typical propagation delay time (tpd) is 14ns under standard conditions.
    • Consider this delay when designing timing-sensitive circuits.
  5. Temperature:

    • Operate the device within the temperature range of -40掳C to 85掳C.
    • Store the device between -65掳C and 150掳C.
  6. Power Dissipation:

    • Ensure that the power dissipation per package does not exceed 100mW to avoid overheating.
    • Use appropriate heat sinks or cooling methods if necessary.
  7. Handling:

    • Handle the device with care to avoid static damage.
    • Follow ESD (Electrostatic Discharge) precautions during handling and assembly.
  8. Testing:

    • Test the device under specified conditions to ensure proper functionality.
    • Use recommended test setups and procedures to validate performance.
(For reference only)

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