Details
BUY IXFK44N50F https://www.utsource.net/itm/p/12609298.html
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | - | 500 | V | |
| Gate-Source Voltage | VGS | -20 | - | 15 | V | |
| Continuous Drain Current | ID | - | 4.4 | - | A | TC = 25掳C |
| Pulse Drain Current | ID(p) | - | 17.6 | - | A | tp = 10 渭s, IG = 10 A, TC = 25掳C |
| Power Dissipation | PTOT | - | - | 310 | W | TC = 25掳C |
| Junction Temperature | TJ | - | - | 150 | 掳C | |
| Storage Temperature | TSTG | -55 | - | 150 | 掳C | |
| Thermal Resistance (Junction to Case) | RthJC | - | 0.88 | - | 掳C/W |
Instructions for Use:
Handling Precautions:
- Handle the IXFK44N50F with care to avoid damage to the leads or body.
- Use proper ESD protection to prevent damage from static electricity.
Mounting:
- Ensure good thermal contact between the device and the heatsink to maximize heat dissipation.
- Use a thermal compound to improve thermal conductivity between the device and the heatsink.
Operating Conditions:
- Do not exceed the maximum ratings specified in the table.
- Ensure that the junction temperature does not exceed 150掳C to prevent thermal damage.
Gate Drive:
- Apply a gate-source voltage (VGS) within the range of -20V to +15V.
- Use a gate resistor to limit the current and protect the gate from overvoltage.
Pulse Operation:
- For pulse operation, ensure that the pulse duration and frequency do not exceed the specified limits to avoid overheating.
Storage:
- Store the device in a dry, cool place within the temperature range of -55掳C to 150掳C.
Testing:
- Perform all tests under controlled conditions to ensure accurate results.
- Use appropriate test equipment and follow safety guidelines.
Soldering:
- Solder the device using a temperature-controlled soldering iron.
- Avoid excessive heat and prolonged heating to prevent damage to the device.
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