Details

---

BUY 40QR21 https://www.utsource.net/itm/p/12609762.html

Parameter	Symbol	Min	Typical	Max	Unit
Supply Voltage	Vcc	4.5	-	5.5	V
Operating Temperature	Toper	-40	-	85	掳C
Storage Temperature	Tstg	-65	-	150	掳C
Output Current (Max)	Iout	-	20	-	mA
Input Capacitance	Cin	-	10	-	pF
Output Capacitance	Cout	-	10	-	pF
Propagation Delay Time	tpd	10	25	40	ns
High-Level Output Voltage	VOH	3.5	-	5.0	V
Low-Level Output Voltage	VOL	0.0	-	0.5	V
High-Level Input Voltage	VIH	3.0	-	5.5	V
Low-Level Input Voltage	VIL	0.0	-	2.0	V

Instructions for Use:

1. Supply Voltage:

   • Ensure the supply voltage (Vcc) is within the range of 4.5V to 5.5V.
   • Do not exceed the maximum supply voltage to avoid damaging the device.

2. Temperature:

   • The operating temperature range is from -40掳C to 85掳C.
   • The storage temperature range is from -65掳C to 150掳C.

3. Output Current:

   • The maximum output current (Iout) is 20mA. Do not exceed this limit to prevent damage.

4. Capacitance:

   • The input capacitance (Cin) and output capacitance (Cout) are both typically 10pF. Ensure external components do not significantly increase these values.

5. Propagation Delay:

   • The propagation delay time (tpd) ranges from 10ns to 40ns, with a typical value of 25ns. This is important for timing considerations in your circuit.

6. Voltage Levels:

   • Ensure that the high-level output voltage (VOH) is at least 3.5V and does not exceed 5.0V.
   • Ensure that the low-level output voltage (VOL) is between 0.0V and 0.5V.
   • The high-level input voltage (VIH) should be between 3.0V and 5.5V.
   • The low-level input voltage (VIL) should be between 0.0V and 2.0V.

7. Handling:

   • Handle the device with care to avoid static discharge, which can damage sensitive components.
   • Follow proper soldering techniques to ensure reliable connections and prevent thermal damage.

8. Mounting:

   • Ensure proper mounting and alignment on the PCB to avoid mechanical stress and ensure good electrical contact.

9. Testing:

   • Before finalizing the design, test the device under various conditions to ensure it meets the required specifications and performance criteria.

(For reference only)