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| Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | 450 | - | V | |
| Gate-Source Voltage | VGS | -20 | - | 20 | V | |
| Continuous Drain Current | ID | - | 30 | - | A | Tc = 25掳C |
| Pulse Drain Current | IDpeak | - | 180 | - | A | tp = 10 ms, ID = 30 A |
| Total Power Dissipation | PTOT | - | 360 | - | W | Tc = 25掳C |
| Junction Temperature | TJ | - | - | 175 | 掳C | |
| Storage Temperature Range | TSTG | -55 | - | 150 | 掳C | |
| Thermal Resistance, Junction to Case | R胃JC | - | 0.5 | - | 掳C/W |
Instructions for Use:
Voltage Ratings:
- Ensure that the drain-source voltage (VDS) does not exceed 450V.
- The gate-source voltage (VGS) should be within 卤20V.
Current Ratings:
- The continuous drain current (ID) should not exceed 30A at a case temperature (Tc) of 25掳C.
- For pulse applications, the peak drain current (IDpeak) can reach up to 180A for a pulse duration (tp) of 10 ms, provided the continuous drain current is 30A.
Power Dissipation:
- The total power dissipation (PTOT) should not exceed 360W at a case temperature (Tc) of 25掳C.
Temperature Considerations:
- The junction temperature (TJ) must not exceed 175掳C.
- Store the device within the storage temperature range (TSTG) of -55掳C to 150掳C.
Thermal Management:
- Use appropriate heat sinks or cooling methods to manage the thermal resistance (R胃JC) of 0.5掳C/W to prevent overheating.
Handling Precautions:
- Handle the device with care to avoid mechanical damage.
- Follow proper ESD (Electrostatic Discharge) precautions to prevent damage to the gate oxide.
Mounting:
- Ensure proper mounting to the heatsink to maintain good thermal contact and effective heat dissipation.
Testing:
- Perform all tests and measurements under controlled conditions to ensure accurate results and device safety.
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