Details
BUY BUV46C https://www.utsource.net/itm/p/12610336.html
| Parameter | Symbol | Min | Typical | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Collector-Emitter Voltage | VCE | - | 600 | - | V | |
| Collector-Base Voltage | VCB | - | 600 | - | V | |
| Emitter-Base Voltage | VEB | - | 5 | - | V | Reverse |
| Collector Current | IC | - | 10 | - | A | Continuous |
| Collector Current (Pulse) | IC(P) | - | 25 | - | A | tP = 10 ms, IF = 0.5 A |
| Power Dissipation | PT | - | 125 | - | W | TA = 25掳C |
| Junction Temperature | TJ | - | - | 150 | 掳C | |
| Storage Temperature | TSTG | -55 | - | 150 | 掳C | |
| Thermal Resistance | RthJC | - | 0.8 | - | 掳C/W | Case to Junction |
Instructions for Use:
Mounting:
- Ensure proper heat sinking to maintain junction temperature below 150掳C.
- Use thermal grease between the transistor and heat sink for better thermal conductivity.
Biasing:
- Apply base current (IB) sufficient to ensure the transistor is in saturation when required.
- Avoid exceeding the maximum collector current (IC) and power dissipation (PT) ratings.
Handling:
- Handle with care to avoid mechanical stress on the leads and body.
- Use appropriate ESD protection to prevent damage from static electricity.
Storage:
- Store in a dry, cool place within the specified storage temperature range (-55掳C to 150掳C).
Testing:
- Use a suitable tester or circuit to verify the parameters under controlled conditions.
- Ensure that the test conditions do not exceed the maximum ratings.
Pulsed Operation:
- For pulsed applications, ensure that the pulse width and frequency do not cause the junction temperature to exceed the maximum allowable value.
Soldering:
- Preheat the PCB to reduce thermal shock.
- Solder quickly to avoid overheating the transistor.
Circuit Design:
- Include appropriate protection circuits such as snubbers and clamping diodes to protect against voltage spikes and transient conditions.
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