Details

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BUY 1117S-2.5 https://www.utsource.net/itm/p/12610593.html

Parameter	Value
Device Type	Low Dropout Linear Regulator
Output Voltage (Vout)	2.5V
Input Voltage Range (Vin)	2.7V to 13.8V
Maximum Output Current (Iout)	1A
Quiescent Current (Iq)	5mA (typical)
Dropout Voltage (Vdo)	1.3V (max at 1A)
Operating Temperature (Toper)	-40掳C to +125掳C
Storage Temperature (Tstg)	-65掳C to +150掳C
Package Type	TO-220, SOT-223, SOT-89
Thermal Resistance (胃JA)	50掳C/W (TO-220)
Protection Features	Overcurrent Protection, Thermal Shutdown

Instructions for Use

1. Circuit Design:

   • Connect the input capacitor (typically 1渭F ceramic) close to the input pin.
   • Connect the output capacitor (typically 10渭F tantalum or 10渭F ceramic) close to the output pin.
   • Ensure the input voltage is within the specified range (2.7V to 13.8V).

2. Heat Dissipation:

   • For high current applications, use a heatsink to manage thermal resistance.
   • The thermal resistance (胃JA) should be considered to ensure the device does not exceed its maximum operating temperature.

3. Stability:

   • The output capacitor must have an ESR (Equivalent Series Resistance) between 1惟 and 10惟 for stability. If using a low ESR capacitor, add a series resistor (1惟 to 10惟) to the output capacitor.

4. Overcurrent and Thermal Protection:

   • The device has built-in overcurrent and thermal shutdown protection. Ensure that the load does not exceed the maximum output current and that the operating temperature remains within the specified range.

5. PCB Layout:

   • Keep the PCB traces short and wide to minimize parasitic inductance and resistance.
   • Ensure proper grounding and decoupling to reduce noise and improve performance.

6. Storage and Handling:

   • Store the device in a dry, cool place.
   • Handle with care to avoid damage to the leads and package.

7. Testing:

   • Before finalizing the design, test the regulator under various conditions to ensure it meets the required specifications.
   • Verify the output voltage, current, and temperature stability during testing.

(For reference only)