Details
BUY CY62128LL-70SI https://www.utsource.net/itm/p/12611623.html
| Parameter | Value/Description |
|---|---|
| Device Type | 128K x 8 CMOS Static RAM (SRAM) |
| Package Type | 28-pin SSOP (Shrink Small Outline Package) |
| Operating Voltage (VCC) | 4.5V to 5.5V |
| Access Time (tAA) | 70 ns |
| Data Retention (VCC) | 1.5V to 5.5V |
| Standby Current (ISB) | 1 渭A (max) at VCC = 5V |
| Active Current (ICC) | 35 mA (max) at VCC = 5V, fCLK = 15 MHz |
| Temperature Range | -40掳C to +85掳C |
| Input Voltage (VIH/VIL) | VIH: 2.0V to VCC, VIL: 0V to 0.8V |
| Output Voltage (VOH/VOL) | VOH: VCC - 0.4V, VOL: 0.4V |
| Power-down Mode | Supports power-down mode with low current consumption |
| Pin Configuration | A0-A16: Address Inputs, DQ0-DQ7: Data I/O, WE: Write Enable, OE: Output Enable, CE: Chip Enable, /WP: Write Protect |
Instructions for Use
Power Supply:
- Connect VCC to the positive supply voltage (4.5V to 5.5V).
- Connect GND to the ground.
Addressing:
- Apply the desired address to the address lines (A0-A16).
Data Input/Output:
- Data is read from or written to the data lines (DQ0-DQ7).
Control Signals:
- Write Enable (WE): Active low. When low, data is written to the addressed location.
- Output Enable (OE): Active low. When low, data is read from the addressed location.
- Chip Enable (CE): Active low. When low, the chip is active.
- Write Protect (/WP): Active low. When low, write operations are inhibited.
Power-down Mode:
- To enter power-down mode, set CE high. This reduces the current consumption to the standby current level.
Temperature Considerations:
- Ensure the operating temperature is within the specified range (-40掳C to +85掳C) to avoid damage or malfunction.
Signal Timing:
- Ensure that all control signals meet the timing requirements, especially the access time (tAA), to avoid data corruption.
Handling Precautions:
- Handle the device with care to avoid electrostatic discharge (ESD) damage. Use proper ESD protection measures.
Storage:
- Store the device in a dry, cool place to prevent moisture damage.
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