Details

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BUY MT42C8255DJ-7 https://www.utsource.net/itm/p/12611648.html

Parameter	Description	Value
Device Type	CMOS 8-Bit I/O Port with Three 8-Bit Ports	-
Package Type	DIP (Dual Inline Package)	40-Pin
Operating Voltage (Vcc)	Supply Voltage Range	4.75V to 5.25V
Operating Temperature	Operating Temperature Range	0掳C to 70掳C
Storage Temperature	Storage Temperature Range	-65掳C to 150掳C
I/O Ports	Number of I/O Ports	3 (A, B, C)
Port A	Bidirectional Port	8 bits
Port B	Bidirectional Port	8 bits
Port C	Bidirectional Port (Can be Split into Two 4-bit)	8 bits
Control Register	Configuration and Control	1 byte
Data Direction Registers	Set Data Direction for Each Port	3 bytes (1 per port)
Power Consumption	Maximum Power Consumption at Vcc = 5V	200 mW
Input Leakage Current	Maximum Input Leakage Current	卤1 渭A
Output Drive Current	Maximum Output Drive Current	卤10 mA
Propagation Delay	Typical Propagation Delay Time	150 ns

Instructions for Use

1. Power Supply:

   • Connect Vcc to a stable 5V power supply.
   • Connect GND to the ground.

2. Configuration:

   • Use the control register to configure the direction of each port (input or output).
   • Write to the control register to set the mode of operation for each port.

3. Data Transfer:

   • Read from or write to the data registers of Port A, Port B, and Port C to transfer data.
   • The data direction for each port can be set using the corresponding data direction register.

4. Port C Functionality:

   • Port C can be split into two 4-bit ports for additional flexibility.
   • Configure the split using the control register.

5. Signal Levels:

   • Ensure that all input signals are within the valid logic levels for the device.
   • Do not exceed the maximum ratings for input and output currents.

6. Handling:

   • Handle the device with care to avoid static damage.
   • Store the device in a dry environment within the specified temperature range.

7. Testing:

   • Test the device in a controlled environment to ensure proper operation.
   • Verify the configuration and data transfer functions using a known good test setup.

(For reference only)