Details
BUY FQB50N06L https://www.utsource.net/itm/p/12612135.html
| Parameter | Symbol | Min | Typ | Max | Unit | Description |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | 60 | V | Maximum drain-source voltage | ||
| Gate-Source Voltage | VGS | -15 | 15 | V | Maximum gate-source voltage | |
| Continuous Drain Current | ID | 5.0 | A | Continuous drain current at TC = 25掳C | ||
| Pulse Drain Current | IGM | 34 | A | Peak pulse drain current | ||
| Power Dissipation | PD | 0.9 | W | Total power dissipation (TC = 25掳C) | ||
| Junction Temperature | TJ | -55 | 150 | 掳C | Operating junction temperature range | |
| Storage Temperature | TSTG | -55 | 150 | 掳C | Storage temperature range |
Instructions for FQB50N06L:
Handling Precautions:
- The FQB50N06L is sensitive to electrostatic discharge (ESD). Use appropriate ESD protection measures during handling and installation.
Mounting:
- Ensure proper heat sinking if the device will be operated near its maximum power dissipation limits.
- Follow recommended PCB layout guidelines to minimize inductance and ensure good thermal performance.
Biasing:
- Apply a gate-source voltage (VGS) within the specified limits (-15V to +15V) to avoid damaging the MOSFET.
- For optimal switching performance, use a gate drive voltage that fully turns on the MOSFET, typically around 10V or higher depending on the application.
Operating Conditions:
- Keep the junction temperature (TJ) within the operational range (-55掳C to +150掳C) to prevent thermal damage.
- Monitor the drain current (ID) and ensure it does not exceed the continuous or pulse ratings specified in the table.
Storage:
- Store the device in a dry environment within the storage temperature range (-55掳C to +150掳C).
Testing:
- Verify all connections and parameters before applying power to the circuit.
- Perform functional tests under typical operating conditions to ensure reliable operation.
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