FQB50N06L

FQB50N06L


Specifications
Details

BUY FQB50N06L https://www.utsource.net/itm/p/12612135.html

Parameter Symbol Min Typ Max Unit Description
Drain-Source Voltage VDS 60 V Maximum drain-source voltage
Gate-Source Voltage VGS -15 15 V Maximum gate-source voltage
Continuous Drain Current ID 5.0 A Continuous drain current at TC = 25掳C
Pulse Drain Current IGM 34 A Peak pulse drain current
Power Dissipation PD 0.9 W Total power dissipation (TC = 25掳C)
Junction Temperature TJ -55 150 掳C Operating junction temperature range
Storage Temperature TSTG -55 150 掳C Storage temperature range

Instructions for FQB50N06L:

  1. Handling Precautions:

    • The FQB50N06L is sensitive to electrostatic discharge (ESD). Use appropriate ESD protection measures during handling and installation.
  2. Mounting:

    • Ensure proper heat sinking if the device will be operated near its maximum power dissipation limits.
    • Follow recommended PCB layout guidelines to minimize inductance and ensure good thermal performance.
  3. Biasing:

    • Apply a gate-source voltage (VGS) within the specified limits (-15V to +15V) to avoid damaging the MOSFET.
    • For optimal switching performance, use a gate drive voltage that fully turns on the MOSFET, typically around 10V or higher depending on the application.
  4. Operating Conditions:

    • Keep the junction temperature (TJ) within the operational range (-55掳C to +150掳C) to prevent thermal damage.
    • Monitor the drain current (ID) and ensure it does not exceed the continuous or pulse ratings specified in the table.
  5. Storage:

    • Store the device in a dry environment within the storage temperature range (-55掳C to +150掳C).
  6. Testing:

    • Verify all connections and parameters before applying power to the circuit.
    • Perform functional tests under typical operating conditions to ensure reliable operation.
(For reference only)

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