HEF4006BP

HEF4006BP


Specifications
SKU
12617535
Details

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Parameter Symbol Min Typ Max Unit
Supply Voltage VDD 3 - 15 V
Input Low Voltage VIL -0.5 - 1.5 V
Input High Voltage VIH 3.5 - VDD+0.5 V
Output Low Voltage VOL -0.5 0.4 0.9 V
Output High Voltage VOH VDD-0.9 VDD-0.4 VDD+0.5 V
Input Leakage Current IIL -1 - 1 μA
Output Leakage Current IOL - - 0.01 mA
Propagation Delay Time (Typical) tpd - 20 - ns
Power Dissipation PD - - 100 mW

Instructions for Use:

  1. Supply Voltage (VDD):

    • Ensure the supply voltage is within the range of 3V to 15V.
    • Avoid exceeding the maximum voltage to prevent damage to the device.
  2. Input Voltages (VIL, VIH):

    • For a low input, the voltage should be between -0.5V and 1.5V.
    • For a high input, the voltage should be between 3.5V and VDD+0.5V.
    • Inputs outside these ranges may not be recognized correctly.
  3. Output Voltages (VOL, VOH):

    • The output low voltage (VOL) should be between -0.5V and 0.9V.
    • The output high voltage (VOH) should be between VDD-0.9V and VDD+0.5V.
    • These levels ensure proper logic levels for interfacing with other digital circuits.
  4. Leakage Currents (IIL, IOL):

    • Input leakage current (IIL) should be between -1μA and 1μA.
    • Output leakage current (IOL) should not exceed 0.01mA.
    • Excessive leakage can affect circuit performance.
  5. Propagation Delay Time (tpd):

    • The typical propagation delay time is 20ns.
    • This value is crucial for timing considerations in your design.
  6. Power Dissipation (PD):

    • The maximum power dissipation is 100mW.
    • Ensure adequate heat sinking or cooling if operating near this limit to avoid thermal damage.
  7. Handling Precautions:

    • Handle the HEF4006BP with care to avoid static damage.
    • Use proper anti-static precautions when handling and installing the device.
  8. Storage Conditions:

    • Store the device in a dry, cool place away from direct sunlight and extreme temperatures.
    • Follow recommended storage conditions to maintain device reliability.
(For reference only)

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