Details
BUY HEF4006BP https://www.utsource.net/itm/p/12617535.html
Parameter | Symbol | Min | Typ | Max | Unit |
---|---|---|---|---|---|
Supply Voltage | VDD | 3 | - | 15 | V |
Input Low Voltage | VIL | -0.5 | - | 1.5 | V |
Input High Voltage | VIH | 3.5 | - | VDD+0.5 | V |
Output Low Voltage | VOL | -0.5 | 0.4 | 0.9 | V |
Output High Voltage | VOH | VDD-0.9 | VDD-0.4 | VDD+0.5 | V |
Input Leakage Current | IIL | -1 | - | 1 | μA |
Output Leakage Current | IOL | - | - | 0.01 | mA |
Propagation Delay Time (Typical) | tpd | - | 20 | - | ns |
Power Dissipation | PD | - | - | 100 | mW |
Instructions for Use:
Supply Voltage (VDD):
- Ensure the supply voltage is within the range of 3V to 15V.
- Avoid exceeding the maximum voltage to prevent damage to the device.
Input Voltages (VIL, VIH):
- For a low input, the voltage should be between -0.5V and 1.5V.
- For a high input, the voltage should be between 3.5V and VDD+0.5V.
- Inputs outside these ranges may not be recognized correctly.
Output Voltages (VOL, VOH):
- The output low voltage (VOL) should be between -0.5V and 0.9V.
- The output high voltage (VOH) should be between VDD-0.9V and VDD+0.5V.
- These levels ensure proper logic levels for interfacing with other digital circuits.
Leakage Currents (IIL, IOL):
- Input leakage current (IIL) should be between -1μA and 1μA.
- Output leakage current (IOL) should not exceed 0.01mA.
- Excessive leakage can affect circuit performance.
Propagation Delay Time (tpd):
- The typical propagation delay time is 20ns.
- This value is crucial for timing considerations in your design.
Power Dissipation (PD):
- The maximum power dissipation is 100mW.
- Ensure adequate heat sinking or cooling if operating near this limit to avoid thermal damage.
Handling Precautions:
- Handle the HEF4006BP with care to avoid static damage.
- Use proper anti-static precautions when handling and installing the device.
Storage Conditions:
- Store the device in a dry, cool place away from direct sunlight and extreme temperatures.
- Follow recommended storage conditions to maintain device reliability.
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