IPW60R125CP

IPW60R125CP


Specifications
SKU
6785125
Details

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Parameter Symbol Min Typ Max Unit Description
On-State Resistance RDS(on) - 60 - Drain-source on-state resistance at ID=12.5A, VGS=10V
Continuous Drain Current ID - - 125 A Continuous drain current at Tc=25°C
Pulse Drain Current Ipp - - 400 A Pulse drain current (t=10ms, Duty=1%)
Gate Charge Qg - 98 - nC Total gate charge at VGS=10V
Input Capacitance Ciss - 3500 - pF Input capacitance at VDS=500V
Output Capacitance Coff - 750 - pF Output capacitance at VDS=500V
Reverse Transfer Capacitance Crss - 2750 - pF Reverse transfer capacitance at VDS=500V
Power Dissipation PD - - 180 W Maximum power dissipation at Tc=25°C
Junction Temperature Tj - - 175 °C Maximum junction temperature

Instructions for Use:

  1. Mounting and Heat Sinking:

    • Ensure adequate heat sinking to manage the maximum power dissipation of 180W.
    • Keep the junction temperature within the specified limit of 175°C.
  2. Gate Drive Requirements:

    • Apply a gate voltage (VGS) of at least 10V to fully turn on the device and achieve the rated on-state resistance.
    • Be mindful of the total gate charge (Qg) when designing the gate drive circuitry to ensure reliable switching.
  3. Current Handling:

    • Do not exceed the continuous drain current (ID) of 125A or the pulse drain current (Ipp) of 400A for short durations.
    • For applications requiring higher currents, consider parallel operation with appropriate current sharing techniques.
  4. Capacitance Considerations:

    • Take into account the input (Ciss), output (Coff), and reverse transfer (Crss) capacitances in high-frequency switching applications to minimize switching losses.
  5. Storage and Handling:

    • Store in a dry environment and handle with care to prevent damage to the device.
    • Follow anti-static precautions to avoid damaging the sensitive components.
  6. Testing and Verification:

    • Verify all parameters under actual operating conditions as datasheet values are typically given under specific test conditions.
    • Perform thermal testing to ensure that the device does not exceed its maximum junction temperature during operation.
(For reference only)

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