Details
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Parameter | Symbol | Test Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
Drain-source on-resistance | RDS(on) | VGS = 10V, ID = 4A | - | 60 | - | mΩ |
Gate-source threshold voltage | VGS(th) | ID = 250μA | 2.0 | - | 4.0 | V |
Continuous drain current | ID | TC = 25°C | - | - | 4 | A |
Power dissipation | PD | TC = 25°C | - | - | 390 | mW |
Junction temperature | TJ | - | -20 | - | 175 | °C |
Storage temperature range | TSTG | - | -65 | - | 150 | °C |
Instructions for STP4NK60Z:
Handling and Storage:
- Store the device in a dry environment to avoid moisture damage.
- Handle with care to prevent electrostatic discharge (ESD) which can damage the MOSFET.
Mounting:
- Ensure proper heat sinking if operating at high currents or power levels to maintain junction temperature within specified limits.
- Use appropriate mounting hardware and thermal interface materials for efficient heat transfer.
Electrical Connections:
- Verify that all connections are secure and correctly wired according to the circuit design.
- Ensure gate drive signals do not exceed the maximum gate-source voltage ratings to prevent damage.
Operating Conditions:
- Operate within the specified continuous drain current and power dissipation limits to ensure reliable operation.
- Monitor the junction temperature during operation to avoid overheating.
Testing:
- When testing the device, use the conditions specified in the parameter table to accurately measure performance characteristics.
- Ensure test equipment is calibrated and capable of providing stable and accurate measurements.
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