Details
BUY TN80C186EB20 https://www.utsource.net/itm/p/8029483.html
Parameter | Description | Value/Range |
---|---|---|
Part Number | Device identifier | TN80C186EB20 |
Package Type | Enclosure type | PQFP (Plastic Quad Flat Pack) |
Pin Count | Number of pins | 80 |
Operating Voltage (Vcc) | Supply voltage range | 5.0 V |
Clock Frequency | Maximum clock frequency | 20 MHz |
Temperature Range | Operating temperature range | -40°C to +85°C |
I/O Standards | Input/output compatibility | TTL |
Data Bus Width | Width of the data bus | 16 bits |
Address Bus Width | Width of the address bus | 24 bits |
Instruction Set | Type of instruction set architecture | x86 compatible |
Cache Size | Size of internal cache memory | 1 KB |
Power Consumption | Typical power consumption | 1.5 W at 20 MHz |
Instructions for Use:
Power Supply Requirements:
- Ensure a stable 5V supply is provided to the Vcc pin.
- Connect appropriate decoupling capacitors near the power pins to reduce noise.
Clock Configuration:
- Provide an external crystal or oscillator to generate the required 20 MHz clock signal.
- Ensure proper connections to the XTAL1 and XTAL2 pins if using a crystal.
Reset Circuit:
- Implement a reset circuit that can provide a clean reset signal to the RESET pin.
- The reset should be held active for at least two clock cycles.
Programming Environment:
- Use an IDE or assembler compatible with the x86 instruction set.
- Refer to the device's datasheet for specific programming guidelines and register configurations.
Heat Management:
- Ensure adequate heat dissipation, especially when operating at higher frequencies.
- Consider using a heatsink if necessary based on thermal calculations.
Signal Integrity:
- Pay attention to PCB layout to minimize crosstalk and ensure signal integrity.
- Keep high-speed signal traces as short as possible and use ground planes effectively.
Testing and Debugging:
- Utilize debugging tools such as in-circuit emulators (ICE) or JTAG interfaces.
- Verify all connections and initial configurations before running extensive tests.
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