TN80C186EB20

TN80C186EB20


Specifications
SKU
8029483
Details

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Parameter Description Value/Range
Part Number Device identifier TN80C186EB20
Package Type Enclosure type PQFP (Plastic Quad Flat Pack)
Pin Count Number of pins 80
Operating Voltage (Vcc) Supply voltage range 5.0 V
Clock Frequency Maximum clock frequency 20 MHz
Temperature Range Operating temperature range -40°C to +85°C
I/O Standards Input/output compatibility TTL
Data Bus Width Width of the data bus 16 bits
Address Bus Width Width of the address bus 24 bits
Instruction Set Type of instruction set architecture x86 compatible
Cache Size Size of internal cache memory 1 KB
Power Consumption Typical power consumption 1.5 W at 20 MHz

Instructions for Use:

  1. Power Supply Requirements:

    • Ensure a stable 5V supply is provided to the Vcc pin.
    • Connect appropriate decoupling capacitors near the power pins to reduce noise.
  2. Clock Configuration:

    • Provide an external crystal or oscillator to generate the required 20 MHz clock signal.
    • Ensure proper connections to the XTAL1 and XTAL2 pins if using a crystal.
  3. Reset Circuit:

    • Implement a reset circuit that can provide a clean reset signal to the RESET pin.
    • The reset should be held active for at least two clock cycles.
  4. Programming Environment:

    • Use an IDE or assembler compatible with the x86 instruction set.
    • Refer to the device's datasheet for specific programming guidelines and register configurations.
  5. Heat Management:

    • Ensure adequate heat dissipation, especially when operating at higher frequencies.
    • Consider using a heatsink if necessary based on thermal calculations.
  6. Signal Integrity:

    • Pay attention to PCB layout to minimize crosstalk and ensure signal integrity.
    • Keep high-speed signal traces as short as possible and use ground planes effectively.
  7. Testing and Debugging:

    • Utilize debugging tools such as in-circuit emulators (ICE) or JTAG interfaces.
    • Verify all connections and initial configurations before running extensive tests.
(For reference only)

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