Details
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| Parameter | Description |
|---|---|
| Device Type | NAND Flash Memory |
| Manufacturer | Samsung |
| Part Number | K9F1208U0C-PCB0 |
| Density | 64 Mbit (8 MB) |
| Voltage - Supply (Vcc) | 3.3 V ( Typical ) |
| Interface | 8-bit Parallel NAND |
| Package / Case | 48-TSOP (II) |
| Operating Temperature | -40°C to +85°C |
| Data Retention | 10 years at 25°C |
| Erase Block Size | 16 KBytes |
| Page Size | 512 Bytes |
| Program Time (Typ) | 200 μs |
| Block Erase Time (Typ) | 2 ms (64KB block) |
| Endurance | 100,000 program/erase cycles |
Instructions for Use:
- Power Supply: Ensure the supply voltage is within the specified range of 3.3V. Avoiding overvoltage can prevent damage to the device.
- Initialization: Upon power-up, the device should be initialized according to the timing specifications provided in the datasheet.
- Command Sequence: Follow the command sequence protocol as outlined in the datasheet for read, write, and erase operations.
- Addressing: The address lines must be properly managed to access the correct memory locations. Ensure no address lines are left floating.
- Timing Requirements: Adhere strictly to the timing requirements for all operations including read, write, and erase to ensure reliable operation.
- Error Handling: Implement error handling mechanisms such as bad block management and wear leveling to maintain data integrity over time.
- Environmental Conditions: Operate the device within the specified temperature range to avoid thermal stress and potential failure.
- Storage: When not in use, store the device in a dry environment to prevent moisture damage.
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